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CVE-2024-53017

MEDIUM CVSS: 6.6 Published: 2025-06-03 Modified: 2026-06-17

Description

Memory corruption while handling test pattern generator IOCTL command.

Affected Platforms

Qualcomm Wcn3620 FirmwareQualcomm Snapdragon 429 Mobile Platform FirmwareQualcomm Snapdragon 429 Mobile PlatformQualcomm Sdm429WQualcomm Sdm429W FirmwareQualcomm Wcn3660BQualcomm Wcn3620Qualcomm Wcn3660B Firmware

Weakness Type

CWE-823

References