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CVE-2024-53023

HIGH CVSS: 7.8 Published: 2025-03-03 Modified: 2026-06-17

Description

Memory corruption may occur while accessing a variable during extended back to back tests.

Affected Platforms

Qualcomm Sa8255PQualcomm Qamsrv1HQualcomm Qca6174AQualcomm Sg4150PQualcomm Qam8775P FirmwareQualcomm Qca6574A FirmwareQualcomm Qcs8250 FirmwareQualcomm Qca6584Au FirmwareQualcomm Qdu1210 FirmwareQualcomm Sa7255P

Weakness Type

CWE-416

References